Single-exposure x-ray dark-field imaging: quantifying sample microstructure using a single-grid setup
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arXiv
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| Format: | Preprint |
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2022
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| author | How, Ying Ying Paganin, David M. Morgan, Kaye S. |
| author_facet | How, Ying Ying Paganin, David M. Morgan, Kaye S. |
| contents | The size of the smallest detectable sample feature in an x-ray imaging system is usually restricted by the spatial resolution of the system. This limitation can now be overcome using the diffusive dark-field signal, which is generated by unresolved phase effects or the ultra-small-angle x-ray scattering from unresolved sample microstructures. A quantitative measure of this dark-field signal can be useful in revealing the microstructure size or material for medical diagnosis, security screening and materials science. Recently, we derived a new method to quantify the diffusive dark-field signal in terms of a scattering angle using a single-exposure grid-based approach. In this manuscript, we look at the problem of quantifying the sample microstructure size from this single-exposure dark-field signal. We do this by quantifying the diffusive dark-field signal produced by 5 different sizes of polystyrene microspheres, ranging from 1.0 $μ$m to 10.8 $μ$m, to investigate how the strength of the dark-field signal changes with the sample microstructure size, $S$. We also explore the feasibility of performing single-exposure dark-field imaging with a simple equation for the optimal propagation distance given microstructure with a specific size and thickness, and successfully verify this equation with experimental data. Our theoretical model predicts that the dark-field scattering angle is inversely proportional to $\sqrt{S}$, which is consistent with our experimental data. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2212_02253 |
| institution | arXiv |
| publishDate | 2022 |
| record_format | arxiv |
| spellingShingle | Single-exposure x-ray dark-field imaging: quantifying sample microstructure using a single-grid setup How, Ying Ying Paganin, David M. Morgan, Kaye S. Medical Physics Optics The size of the smallest detectable sample feature in an x-ray imaging system is usually restricted by the spatial resolution of the system. This limitation can now be overcome using the diffusive dark-field signal, which is generated by unresolved phase effects or the ultra-small-angle x-ray scattering from unresolved sample microstructures. A quantitative measure of this dark-field signal can be useful in revealing the microstructure size or material for medical diagnosis, security screening and materials science. Recently, we derived a new method to quantify the diffusive dark-field signal in terms of a scattering angle using a single-exposure grid-based approach. In this manuscript, we look at the problem of quantifying the sample microstructure size from this single-exposure dark-field signal. We do this by quantifying the diffusive dark-field signal produced by 5 different sizes of polystyrene microspheres, ranging from 1.0 $μ$m to 10.8 $μ$m, to investigate how the strength of the dark-field signal changes with the sample microstructure size, $S$. We also explore the feasibility of performing single-exposure dark-field imaging with a simple equation for the optimal propagation distance given microstructure with a specific size and thickness, and successfully verify this equation with experimental data. Our theoretical model predicts that the dark-field scattering angle is inversely proportional to $\sqrt{S}$, which is consistent with our experimental data. |
| title | Single-exposure x-ray dark-field imaging: quantifying sample microstructure using a single-grid setup |
| topic | Medical Physics Optics |
| url | https://arxiv.org/abs/2212.02253 |