Simultaneous false discovery proportion bounds via knockoffs and closed testing

Fuente: arXiv

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Bibliographic Details
Main Authors:	Li, Jinzhou, Maathuis, Marloes H., Goeman, Jelle J.
Format:	Preprint
Published:	2022
Subjects:	Methodology
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2212.12822