Learning to mask: Towards generalized face forgery detection

Fuente: arXiv

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Bibliographic Details
Main Authors:	Fei, Jianwei, Dai, Yunshu, Wang, Huaming, Xia, Zhihua
Format:	Preprint
Published:	2022
Subjects:	Computer Vision and Pattern Recognition
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2212.14309