Label-free incoherent super-resolution optical microscopy
Fuente:
arXiv
Enregistré dans:
| Auteurs principaux: | , , , , , , , , |
|---|---|
| Format: | Preprint |
| Publié: |
2023
|
| Sujets: | |
| Accès en ligne: | |
| Tags: |
Ajouter un tag
Pas de tags, Soyez le premier à ajouter un tag!
|
| _version_ | 1866909311460966400 |
|---|---|
| author | Jayakumar, Nikhil Villegas-Hernandez, Luis E. Zhao, Weisong Mao, Hong Dullo, Firehun T Tinguley, Jean Claude Sagini, Krizia Llorente, Alicia Ahluwalia, Balpreet Singh |
| author_facet | Jayakumar, Nikhil Villegas-Hernandez, Luis E. Zhao, Weisong Mao, Hong Dullo, Firehun T Tinguley, Jean Claude Sagini, Krizia Llorente, Alicia Ahluwalia, Balpreet Singh |
| contents | The photo-kinetics of fluorescent molecules have enabled the circumvention of far-field optical diffraction-limit. Despite its enormous potential, the necessity to label the sample may adversely influence the delicate biology under investigation. Thus, continued development efforts are needed to surpass the far-field label-free diffraction barrier. The coherence of the detected light in label-free mode hinders the application of existing super-resolution methods based on incoherent fluorescence imaging. In this article, we present the physics and propose a methodology to circumvent this challenge by exploiting the photoluminescence of silicon nitride waveguides for near-field illumination of unlabeled samples. The technique is abbreviated EPSLON, Evanescently decaying Photoluminescence Scattering enables Label-free Optical Nanoscopy. We demonstrate that such an illumination has properties that mimic the photo-kinetics of nano-sized fluorescent molecules. This allows for developing a label-free incoherent system that is linear in intensity, and stable with time thereby permitting the application of techniques like structured illumination microscopy (SIM) and intensity-fluctuation-based optical nanoscopy (IFON) in label-free mode to circumvent the diffraction limit. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2301_03451 |
| institution | arXiv |
| publishDate | 2023 |
| record_format | arxiv |
| spellingShingle | Label-free incoherent super-resolution optical microscopy Jayakumar, Nikhil Villegas-Hernandez, Luis E. Zhao, Weisong Mao, Hong Dullo, Firehun T Tinguley, Jean Claude Sagini, Krizia Llorente, Alicia Ahluwalia, Balpreet Singh Optics The photo-kinetics of fluorescent molecules have enabled the circumvention of far-field optical diffraction-limit. Despite its enormous potential, the necessity to label the sample may adversely influence the delicate biology under investigation. Thus, continued development efforts are needed to surpass the far-field label-free diffraction barrier. The coherence of the detected light in label-free mode hinders the application of existing super-resolution methods based on incoherent fluorescence imaging. In this article, we present the physics and propose a methodology to circumvent this challenge by exploiting the photoluminescence of silicon nitride waveguides for near-field illumination of unlabeled samples. The technique is abbreviated EPSLON, Evanescently decaying Photoluminescence Scattering enables Label-free Optical Nanoscopy. We demonstrate that such an illumination has properties that mimic the photo-kinetics of nano-sized fluorescent molecules. This allows for developing a label-free incoherent system that is linear in intensity, and stable with time thereby permitting the application of techniques like structured illumination microscopy (SIM) and intensity-fluctuation-based optical nanoscopy (IFON) in label-free mode to circumvent the diffraction limit. |
| title | Label-free incoherent super-resolution optical microscopy |
| topic | Optics |
| url | https://arxiv.org/abs/2301.03451 |