ODIM: Outlier Detection via Likelihood of Under-Fitted Generative Models

Fuente: arXiv

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Bibliographic Details
Main Authors:	Kim, Dongha, Hwang, Jaesung, Lee, Jongjin, Kim, Kunwoong, Kim, Yongdai
Format:	Preprint
Published:	2023
Subjects:	Machine Learning Artificial Intelligence
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2301.04257