Detecting charge transfer at defects in 2D materials with electron ptychography

Fuente: arXiv

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Bibliographic Details
Main Authors:	Hofer, Christoph, Madsen, Jacob, Susi, Toma, Pennycook, Timothy J.
Format:	Preprint
Published:	2023
Subjects:	Materials Science Applied Physics Computational Physics
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2301.04469