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Detecting charge transfer at defects in 2D materials with electron ptychography

Fuente: arXiv

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Detalles Bibliográficos
Autores principales:	Hofer, Christoph, Madsen, Jacob, Susi, Toma, Pennycook, Timothy J.
Formato:	Preprint
Publicado:	2023
Materias:	Materials Science Applied Physics Computational Physics
Acceso en línea:	Acceder al recurso
Etiquetas:	Agregar Etiqueta Sin Etiquetas, Sea el primero en etiquetar este registro!

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