Detecting charge transfer at defects in 2D materials with electron ptychography

Documenti analoghi

• Detecting charge transfer at defects in 2D materials with electron ptychography
  di: Christoph Hofer, et al.
  Pubblicazione: (2025)
• Investigating the convergence properties of iterative ptychography for atomic-resolution low-dose imaging
  di: Chennit, Tamazouzt, et al.
  Pubblicazione: (2025)
• Surface morphology and thickness variation estimation of zeolites via electron ptychography
  di: Zhang, Enci, et al.
  Pubblicazione: (2025)
• Electron Fourier ptychography for phase reconstruction
  di: Zhao, Jingjing, et al.
  Pubblicazione: (2025)
• Improving the low-dose performance of aberration correction in single sideband ptychography
  di: Li, Songge, et al.
  Pubblicazione: (2025)