Statistical Learning with Sublinear Regret of Propagator Models

Fuente: arXiv

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Bibliographic Details
Main Authors:	Neuman, Eyal, Zhang, Yufei
Format:	Preprint
Published:	2023
Subjects:	Trading and Market Microstructure Machine Learning Probability 62L05, 60H30, 91G80, 68Q32, 93C73, 93E35, 62G08
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2301.05157