Simultaneous Measurement of Mid-Infrared Refractive Indices in Thin-Film Heterostructures: Methodology and Results for GaAs/AlGaAs

Fuente: arXiv

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Bibliographic Details
Main Authors:	Perner, Lukas W., Truong, Gar-Wing, Follman, David, Prinz, Maximilian, Winkler, Georg, Puchegger, Stephan, Cole, Garrett D., Heckl, Oliver H.
Format:	Preprint
Published:	2023
Subjects:	Optics Materials Science Instrumentation and Detectors
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2301.08293