Posterior risk of modular and semi-modular Bayesian inference

Fuente: arXiv

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Bibliographic Details
Main Authors:	Frazier, David T., Nott, David J.
Format:	Preprint
Published:	2023
Subjects:	Methodology Statistics Theory Computation
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2301.10911