IM-IAD: Industrial Image Anomaly Detection Benchmark in Manufacturing

Fuente: arXiv

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Bibliographic Details
Main Authors:	Xie, Guoyang, Wang, Jinbao, Liu, Jiaqi, Lyu, Jiayi, Liu, Yong, Wang, Chengjie, Zheng, Feng, Jin, Yaochu
Format:	Preprint
Published:	2023
Subjects:	Computer Vision and Pattern Recognition Artificial Intelligence
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2301.13359