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IM-IAD: Industrial Image Anomaly Detection Benchmark in Manufacturing

Fuente: arXiv

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Detalles Bibliográficos
Autores principales:	Xie, Guoyang, Wang, Jinbao, Liu, Jiaqi, Lyu, Jiayi, Liu, Yong, Wang, Chengjie, Zheng, Feng, Jin, Yaochu
Formato:	Preprint
Publicado:	2023
Materias:	Computer Vision and Pattern Recognition Artificial Intelligence
Acceso en línea:	Acceder al recurso
Etiquetas:	Agregar Etiqueta Sin Etiquetas, Sea el primero en etiquetar este registro!

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