Inversion Symmetry Breaking in Epitaxial Ultrathin Bi (111) Films

Fuente: arXiv
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Auteurs principaux: Inbar, Hadass S., Zubair, Muhammad, Dong, Jason T., Engel, Aaron N, Dempsey, Connor P., Chang, Yu Hao, Nishihaya, Shinichi, Khalid, Shoaib, Fedorov, Alexei V., Janotti, Anderson, Palmstrøm, Chris J.
Format: Preprint
Publié: 2023
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author Inbar, Hadass S.
Zubair, Muhammad
Dong, Jason T.
Engel, Aaron N
Dempsey, Connor P.
Chang, Yu Hao
Nishihaya, Shinichi
Khalid, Shoaib
Fedorov, Alexei V.
Janotti, Anderson
Palmstrøm, Chris J.
author_facet Inbar, Hadass S.
Zubair, Muhammad
Dong, Jason T.
Engel, Aaron N
Dempsey, Connor P.
Chang, Yu Hao
Nishihaya, Shinichi
Khalid, Shoaib
Fedorov, Alexei V.
Janotti, Anderson
Palmstrøm, Chris J.
contents Bismuth (Bi) films hold potential for spintronic devices and topological one-dimensional edge transport. Large-area high-quality (111) Bi ultrathin films are grown on InSb (111)B substrates. Strong film-substrate interactions epitaxially stabilize the (111) orientation and lead to inversion symmetry breaking. We resolve the longstanding controversy over the Z_2 topological assignment of bismuth and show that the surface states are topologically trivial. Our results demonstrate that interfacial bonds prevent the semimetal-to-semiconductor transition predicted for freestanding bismuth layers, highlighting the importance of controlled functionalization and surface passivation in two-dimensional materials.
format Preprint
id arxiv_https___arxiv_org_abs_2302_00803
institution arXiv
publishDate 2023
record_format arxiv
spellingShingle Inversion Symmetry Breaking in Epitaxial Ultrathin Bi (111) Films
Inbar, Hadass S.
Zubair, Muhammad
Dong, Jason T.
Engel, Aaron N
Dempsey, Connor P.
Chang, Yu Hao
Nishihaya, Shinichi
Khalid, Shoaib
Fedorov, Alexei V.
Janotti, Anderson
Palmstrøm, Chris J.
Materials Science
Bismuth (Bi) films hold potential for spintronic devices and topological one-dimensional edge transport. Large-area high-quality (111) Bi ultrathin films are grown on InSb (111)B substrates. Strong film-substrate interactions epitaxially stabilize the (111) orientation and lead to inversion symmetry breaking. We resolve the longstanding controversy over the Z_2 topological assignment of bismuth and show that the surface states are topologically trivial. Our results demonstrate that interfacial bonds prevent the semimetal-to-semiconductor transition predicted for freestanding bismuth layers, highlighting the importance of controlled functionalization and surface passivation in two-dimensional materials.
title Inversion Symmetry Breaking in Epitaxial Ultrathin Bi (111) Films
topic Materials Science
url https://arxiv.org/abs/2302.00803