Effective Random Test Generation for Deep Learning Compilers

Fuente: arXiv

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Bibliographic Details
Main Authors:	Ren, Luyao, Wang, ZiHeng, Xiong, Yingfei, Zhang, Li, Jiang, Guoyue, Xie, Tao
Format:	Preprint
Published:	2023
Subjects:	Software Engineering
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2302.00842