Understanding metric-related pitfalls in image analysis validation

Fuente: arXiv
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Bibliographic Details
Main Authors: Reinke, Annika, Tizabi, Minu D., Baumgartner, Michael, Eisenmann, Matthias, Heckmann-Nötzel, Doreen, Kavur, A. Emre, Rädsch, Tim, Sudre, Carole H., Acion, Laura, Antonelli, Michela, Arbel, Tal, Bakas, Spyridon, Benis, Arriel, Blaschko, Matthew, Buettner, Florian, Cardoso, M. Jorge, Cheplygina, Veronika, Chen, Jianxu, Christodoulou, Evangelia, Cimini, Beth A., Collins, Gary S., Farahani, Keyvan, Ferrer, Luciana, Galdran, Adrian, van Ginneken, Bram, Glocker, Ben, Godau, Patrick, Haase, Robert, Hashimoto, Daniel A., Hoffman, Michael M., Huisman, Merel, Isensee, Fabian, Jannin, Pierre, Kahn, Charles E., Kainmueller, Dagmar, Kainz, Bernhard, Karargyris, Alexandros, Karthikesalingam, Alan, Kenngott, Hannes, Kleesiek, Jens, Kofler, Florian, Kooi, Thijs, Kopp-Schneider, Annette, Kozubek, Michal, Kreshuk, Anna, Kurc, Tahsin, Landman, Bennett A., Litjens, Geert, Madani, Amin, Maier-Hein, Klaus, Martel, Anne L., Mattson, Peter, Meijering, Erik, Menze, Bjoern, Moons, Karel G. M., Müller, Henning, Nichyporuk, Brennan, Nickel, Felix, Petersen, Jens, Rafelski, Susanne M., Rajpoot, Nasir, Reyes, Mauricio, Riegler, Michael A., Rieke, Nicola, Saez-Rodriguez, Julio, Sánchez, Clara I., Shetty, Shravya, van Smeden, Maarten, Summers, Ronald M., Taha, Abdel A., Tiulpin, Aleksei, Tsaftaris, Sotirios A., Van Calster, Ben, Varoquaux, Gaël, Wiesenfarth, Manuel, Yaniv, Ziv R., Jäger, Paul F., Maier-Hein, Lena
Format: Preprint
Published: 2023
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