Cita APA (7a ed.)

Sendra, J., Haake, F., Calvo, M., Galinski, H., & Spolenak, R. (2023). Scanning Reflectance Anisotropy Microscopy for Multi-Material Strain Mapping.

Cita Chicago Style (17a ed.)

Sendra, Joan, Fabian Haake, Micha Calvo, Henning Galinski, y Ralph Spolenak. Scanning Reflectance Anisotropy Microscopy for Multi-Material Strain Mapping. 2023.

Cita MLA (9a ed.)

Sendra, Joan, et al. Scanning Reflectance Anisotropy Microscopy for Multi-Material Strain Mapping. 2023.