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Scanning Reflectance Anisotropy Microscopy for Multi-Material Strain Mapping

Fuente: arXiv

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Détails bibliographiques
Auteurs principaux:	Sendra, Joan, Haake, Fabian, Calvo, Micha, Galinski, Henning, Spolenak, Ralph
Format:	Preprint
Publié:	2023
Sujets:	Optics Materials Science Instrumentation and Detectors
Accès en ligne:	Acceder al recurso
Tags:	Ajouter un tag Pas de tags, Soyez le premier à ajouter un tag!

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