Investigation of Cryogenic Current-Voltage Anomalies in SiGe HBTs: Role of Base-Emitter Junction Inhomogeneities

Fuente: arXiv

Saved in:

Bibliographic Details
Main Authors:	Naik, Nachiket R., Gabritchidze, Bekari, Chen, Justin H., Kooi, Jacob, Cleary, Kieran A., Minnich, Austin J.
Format:	Preprint
Published:	2023
Subjects:	Instrumentation and Detectors Applied Physics
Online Access:	Acceder al recurso
Tags:	Add Tag No Tags, Be the first to tag this record!

Internet

https://arxiv.org/abs/2302.14210