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Investigation of Cryogenic Current-Voltage Anomalies in SiGe HBTs: Role of Base-Emitter Junction Inhomogeneities

Fuente: arXiv

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Detalles Bibliográficos
Autores principales:	Naik, Nachiket R., Gabritchidze, Bekari, Chen, Justin H., Kooi, Jacob, Cleary, Kieran A., Minnich, Austin J.
Formato:	Preprint
Publicado:	2023
Materias:	Instrumentation and Detectors Applied Physics
Acceso en línea:	Acceder al recurso
Etiquetas:	Agregar Etiqueta Sin Etiquetas, Sea el primero en etiquetar este registro!

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