Cover Image

Assessment of error variation in high-fidelity two-qubit gates in silicon

Fuente: arXiv

Saved in:

Bibliographic Details
Main Authors:	Tanttu, Tuomo, Lim, Wee Han, Huang, Jonathan Y., Stuyck, Nard Dumoulin, Gilbert, Will, Su, Rocky Y., Feng, MengKe, Cifuentes, Jesus D., Seedhouse, Amanda E., Seritan, Stefan K., Ostrove, Corey I., Rudinger, Kenneth M., Leon, Ross C. C., Huang, Wister, Escott, Christopher C., Itoh, Kohei M., Abrosimov, Nikolay V., Pohl, Hans-Joachim, Thewalt, Michael L. W., Hudson, Fay E., Blume-Kohout, Robin, Bartlett, Stephen D., Morello, Andrea, Laucht, Arne, Yang, Chih Hwan, Saraiva, Andre, Dzurak, Andrew S.
Format:	Preprint
Published:	2023
Subjects:	Quantum Physics Mesoscale and Nanoscale Physics
Online Access:	Acceder al recurso
Tags:	Add Tag No Tags, Be the first to tag this record!

Internet

https://arxiv.org/abs/2303.04090