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Assessment of error variation in high-fidelity two-qubit gates in silicon

Fuente: arXiv

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Détails bibliographiques
Auteurs principaux:	Tanttu, Tuomo, Lim, Wee Han, Huang, Jonathan Y., Stuyck, Nard Dumoulin, Gilbert, Will, Su, Rocky Y., Feng, MengKe, Cifuentes, Jesus D., Seedhouse, Amanda E., Seritan, Stefan K., Ostrove, Corey I., Rudinger, Kenneth M., Leon, Ross C. C., Huang, Wister, Escott, Christopher C., Itoh, Kohei M., Abrosimov, Nikolay V., Pohl, Hans-Joachim, Thewalt, Michael L. W., Hudson, Fay E., Blume-Kohout, Robin, Bartlett, Stephen D., Morello, Andrea, Laucht, Arne, Yang, Chih Hwan, Saraiva, Andre, Dzurak, Andrew S.
Format:	Preprint
Publié:	2023
Sujets:	Quantum Physics Mesoscale and Nanoscale Physics
Accès en ligne:	Acceder al recurso
Tags:	Ajouter un tag Pas de tags, Soyez le premier à ajouter un tag!

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