Advanced Techniques in Automated High Resolution Scanning Transmission Electron Microscopy

Fuente: arXiv
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Auteurs principaux: Pattison, Alexander, Pedroso, Cassio C. S., Cohen, Bruce E., Ondry, Justin C., Alivisatos, A. Paul, Theis, Wolfgang, Ercius, Peter
Format: Preprint
Publié: 2023
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author Pattison, Alexander
Pedroso, Cassio C. S.
Cohen, Bruce E.
Ondry, Justin C.
Alivisatos, A. Paul
Theis, Wolfgang
Ercius, Peter
author_facet Pattison, Alexander
Pedroso, Cassio C. S.
Cohen, Bruce E.
Ondry, Justin C.
Alivisatos, A. Paul
Theis, Wolfgang
Ercius, Peter
contents Scanning transmission electron microscopy is a common tool used to study the atomic structure of materials. It is an inherently multimodal tool allowing for the simultaneous acquisition of multiple information channels. Despite its versatility, however, experimental workflows currently rely heavily on experienced human operators and can only acquire data from small regions of a sample at a time. Here, we demonstrate a flexible pipeline-based system for high-throughput acquisition of atomic-resolution structural data using a custom built sample stage and automation program. The program is capable of operating over many hours without human intervention improving the statistics of high-resolution experiments.
format Preprint
id arxiv_https___arxiv_org_abs_2303_05543
institution arXiv
publishDate 2023
record_format arxiv
spellingShingle Advanced Techniques in Automated High Resolution Scanning Transmission Electron Microscopy
Pattison, Alexander
Pedroso, Cassio C. S.
Cohen, Bruce E.
Ondry, Justin C.
Alivisatos, A. Paul
Theis, Wolfgang
Ercius, Peter
Instrumentation and Detectors
Scanning transmission electron microscopy is a common tool used to study the atomic structure of materials. It is an inherently multimodal tool allowing for the simultaneous acquisition of multiple information channels. Despite its versatility, however, experimental workflows currently rely heavily on experienced human operators and can only acquire data from small regions of a sample at a time. Here, we demonstrate a flexible pipeline-based system for high-throughput acquisition of atomic-resolution structural data using a custom built sample stage and automation program. The program is capable of operating over many hours without human intervention improving the statistics of high-resolution experiments.
title Advanced Techniques in Automated High Resolution Scanning Transmission Electron Microscopy
topic Instrumentation and Detectors
url https://arxiv.org/abs/2303.05543