Advanced Techniques in Automated High Resolution Scanning Transmission Electron Microscopy
Fuente:
arXiv
Guardado en:
| Autores principales: | , , , , , , |
|---|---|
| Formato: | Preprint |
| Publicado: |
2023
|
| Materias: | |
| Acceso en línea: | |
| Etiquetas: |
Agregar Etiqueta
Sin Etiquetas, Sea el primero en etiquetar este registro!
|
| _version_ | 1866909309996105728 |
|---|---|
| author | Pattison, Alexander Pedroso, Cassio C. S. Cohen, Bruce E. Ondry, Justin C. Alivisatos, A. Paul Theis, Wolfgang Ercius, Peter |
| author_facet | Pattison, Alexander Pedroso, Cassio C. S. Cohen, Bruce E. Ondry, Justin C. Alivisatos, A. Paul Theis, Wolfgang Ercius, Peter |
| contents | Scanning transmission electron microscopy is a common tool used to study the atomic structure of materials. It is an inherently multimodal tool allowing for the simultaneous acquisition of multiple information channels. Despite its versatility, however, experimental workflows currently rely heavily on experienced human operators and can only acquire data from small regions of a sample at a time. Here, we demonstrate a flexible pipeline-based system for high-throughput acquisition of atomic-resolution structural data using a custom built sample stage and automation program. The program is capable of operating over many hours without human intervention improving the statistics of high-resolution experiments. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2303_05543 |
| institution | arXiv |
| publishDate | 2023 |
| record_format | arxiv |
| spellingShingle | Advanced Techniques in Automated High Resolution Scanning Transmission Electron Microscopy Pattison, Alexander Pedroso, Cassio C. S. Cohen, Bruce E. Ondry, Justin C. Alivisatos, A. Paul Theis, Wolfgang Ercius, Peter Instrumentation and Detectors Scanning transmission electron microscopy is a common tool used to study the atomic structure of materials. It is an inherently multimodal tool allowing for the simultaneous acquisition of multiple information channels. Despite its versatility, however, experimental workflows currently rely heavily on experienced human operators and can only acquire data from small regions of a sample at a time. Here, we demonstrate a flexible pipeline-based system for high-throughput acquisition of atomic-resolution structural data using a custom built sample stage and automation program. The program is capable of operating over many hours without human intervention improving the statistics of high-resolution experiments. |
| title | Advanced Techniques in Automated High Resolution Scanning Transmission Electron Microscopy |
| topic | Instrumentation and Detectors |
| url | https://arxiv.org/abs/2303.05543 |