Image de couverture de livre

Advanced Techniques in Automated High Resolution Scanning Transmission Electron Microscopy

Fuente: arXiv

Enregistré dans:

Détails bibliographiques
Auteurs principaux:	Pattison, Alexander, Pedroso, Cassio C. S., Cohen, Bruce E., Ondry, Justin C., Alivisatos, A. Paul, Theis, Wolfgang, Ercius, Peter
Format:	Preprint
Publié:	2023
Sujets:	Instrumentation and Detectors
Accès en ligne:	Acceder al recurso
Tags:	Ajouter un tag Pas de tags, Soyez le premier à ajouter un tag!

Documents similaires

BEACON -- Automated Aberration Correction for Scanning Transmission Electron Microscopy using Bayesian Optimization
par: Pattison, Alexander J., et autres
Publié: (2024)

Noise2Void for Denoising Atomic Resolution Scanning Transmission Electron Microscopy Images
par: Thornley, William, et autres
Publié: (2026)

Scanning Transmission Electron Microscopy of Oxide Interfaces and Heterostructures
par: Spurgeon, Steven R.
Publié: (2020)

Robust electron counting for direct electron detectors with the Back-Propagation Counting method
par: Renner, Joshua, et autres
Publié: (2025)

Open Gas-Cell Transmission Electron Microscopy at 50 pm Resolution
par: Biran, Idan, et autres
Publié: (2025)

Measurement of the Resolution of the Timepix4 Detector for 100 keV and 200 keV Electrons for Transmission Electron Microscopy
par: Dimova, N., et autres
Publié: (2024)

A Transformer-based Model for Rapid Microstructure Inference from Four-Dimensional Scanning Transmission Electron Microscopy Data
par: Je, Kwanghwi, et autres
Publié: (2026)

High Dynamic Range Scanning Tunneling Microscopy
par: Karić, Ajla, et autres
Publié: (2024)

Comparison of Impedance Matching Networks for Scanning Microwave Microscopy
par: Hoffmann, Johannes, et autres
Publié: (2024)

Advancing Time-Resolved Spectroscopies with Custom Scanning Units and Event-Based Electron Detection
par: Auad, Yves, et autres
Publié: (2025)

High-throughput Parasitic-independent Probe Thermal Resistance Calibration for Robust Thermal Mapping with Scanning Thermal Microscopy
par: Munde, Ram, et autres
Publié: (2025)

Scanning Tunneling Microscopy in high vectorial magnetic fields
par: Ozores, Jaime Rumeu, et autres
Publié: (2026)

Mic-hackathon 2024: Hackathon on Machine Learning for Electron and Scanning Probe Microscopy
par: Pratiush, Utkarsh, et autres
Publié: (2025)

A Laser Phase Plate for Transmission Electron Microscopy
par: Axelrod, Jeremy J.
Publié: (2024)

Towards Low-Energy Electron High-Resolution Spectroscopy with Transition-Edge Sensors
par: Ammendola, R., et autres
Publié: (2026)

afspm: A Framework for Manufacturer-Agnostic Automation in Scanning Probe Microscopy
par: Sullivan, Nicholas J., et autres
Publié: (2025)

Full-Field Brillouin Microscopy with a Scanning Fabry-Perot Interferometer
par: Pochylski, Mikolaj
Publié: (2025)

Directional Dark Field for Nanoscale Full-Field Transmission X-Ray Microscopy
par: Wirtensohn, Sami, et autres
Publié: (2025)

Nanoscale Dark-Field Imaging in Full-Field Transmission X-Ray Microscopy
par: Wirtensohn, Sami, et autres
Publié: (2024)

Nanoscale Three-Dimensional Imaging of Integrated Circuits using a Scanning Electron Microscope and Transition-Edge Sensor Spectrometer
par: Nakamura, Nathan, et autres
Publié: (2022)

Scanning Acoustic Microscopy for Quantifying Bubble Evolution in Alkaline Water Electrolyzers
par: Dou, Zehua, et autres
Publié: (2024)

Detection of MEMS Acoustics via Scanning Tunneling Microscopy
par: Elbertse, R. J. G., et autres
Publié: (2026)

The 4D Camera: an 87 kHz direct electron detector for scanning/transmission electron microscopy
par: Ercius, Peter, et autres
Publié: (2023)

High-Resolution Electron Paramagnetic Resonance
par: Stephen, Colin J., et autres
Publié: (2026)

Practical Crystallography with a Transmission Electron Microscope
par: Weare, Benjamin L., et autres
Publié: (2025)

Coplanar waveguide ground potentials imbalance as a source of useful signal in Near-Field Scanning Microwave Microscopy
par: Gladilovich, P. A., et autres
Publié: (2024)

Scanning Reflectance Anisotropy Microscopy for Multi-Material Strain Mapping
par: Sendra, Joan, et autres
Publié: (2023)

Streaming Large-Scale Electron Microscopy Data to a Supercomputing Facility
par: Welborn, Samuel S., et autres
Publié: (2024)

Optical Data Transmission ASICs for the High-Luminosity LHC (HL-LHC) Experiments
par: Li, Xiaoting, et autres
Publié: (2024)

Quantifying Resolution in Pink Beam Dark Field X-ray Microscopy: Experiments and Simulations
par: La Bella, Michela, et autres
Publié: (2025)

A Helical-Deflector-Based Radio-Frequency Spiral Scanning System for keV Energy Electrons
par: Zhamkochyan, Simon, et autres
Publié: (2026)

GRANITE: High-Resolution Imaging and Electrical Qualification of Large-Area TPC Electrodes
par: Mitra, Shumit A., et autres
Publié: (2025)

Development of a High-Resolution, High-Dynamic-Range Charge Detector for Ion Beam Monitoring
par: Adriani, O., et autres
Publié: (2024)

Low-Resolution Imaging FMCW Lidar
par: Gazizov, Iskander, et autres
Publié: (2022)

Solving Complex Nanostructures With Ptychographic Atomic Electron Tomography
par: Pelz, Philipp M, et autres
Publié: (2022)

Comparison of Kikuchi Diffraction Geometries in Scanning Electron Microscope
par: Zhang, Tianbi, et autres
Publié: (2024)

Implementing dynamic high-performance computing supported workflows on Scanning Transmission Electron Microscope
par: Pratiush, Utkarsh, et autres
Publié: (2024)

Terahertz Frequency Comb High-Resolution Heterodyne Spectrometer
par: Hindle, Francis, et autres
Publié: (2024)

Electron Energy Loss Spectroscopy of 2D Materials in a Scanning Electron Microscope
par: Simonaitis, John W., et autres
Publié: (2024)

Algorithms for Achieving Subpixel Resolution in Muon Tomography
par: Romano, Matthew Mark, et autres
Publié: (2025)