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Relations between quantum metrology and criticality in general su(1, 1) systems

Fuente: arXiv

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Detalles Bibliográficos
Autores principales:	Zhang, Rui, Ding, Wenkui, Zhang, Zhucheng, Shao, Lei, Zhang, Yuyu, Wang, Xiaoguang
Formato:	Preprint
Publicado:	2023
Materias:	Quantum Physics
Acceso en línea:	Acceder al recurso
Etiquetas:	Agregar Etiqueta Sin Etiquetas, Sea el primero en etiquetar este registro!

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