Femtosecond reduction of atomic scattering factors triggered by intense x-ray pulse
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arXiv
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| Format: | Preprint |
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2023
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| _version_ | 1866909080009834496 |
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| author | Inoue, Ichiro Yamada, Jumpei Kapcia, Konrad J. Stransky, Michal Tkachenko, Victor Jurek, Zoltan Inoue, Takato Osaka, Taito Inubushi, Yuichi Ito, Atsuki Tanaka, Yuto Matsuyama, Satoshi Yamauchi, Kazuto Yabashi, Makina Ziaja, Beata |
| author_facet | Inoue, Ichiro Yamada, Jumpei Kapcia, Konrad J. Stransky, Michal Tkachenko, Victor Jurek, Zoltan Inoue, Takato Osaka, Taito Inubushi, Yuichi Ito, Atsuki Tanaka, Yuto Matsuyama, Satoshi Yamauchi, Kazuto Yabashi, Makina Ziaja, Beata |
| contents | X-ray diffraction of silicon irradiated with tightly focused femtosecond x-ray pulses (photon energy: 11.5 keV, pulse duration: 6 fs) was measured at various x-ray intensities up to $4.6\times10^{19}$ W/cm$^2$. The measurement reveals that the diffraction intensity is highly suppressed when the x-ray intensity reaches of the order of $10^{19}$ W/cm$^2$. With a dedicated simulation, we confirm the observed reduction of the diffraction intensity is attributed to the femtosecond change in individual atomic scattering factors due to the ultrafast creation of highly ionized atoms through photoionization, Auger decay, and subsequent collisional ionization. We anticipate that this ultrafast reduction of atomic scattering factor will be a basis for new x-ray nonlinear techniques, such as pulse shortening and contrast variation x-ray scattering. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2304_05948 |
| institution | arXiv |
| publishDate | 2023 |
| record_format | arxiv |
| spellingShingle | Femtosecond reduction of atomic scattering factors triggered by intense x-ray pulse Inoue, Ichiro Yamada, Jumpei Kapcia, Konrad J. Stransky, Michal Tkachenko, Victor Jurek, Zoltan Inoue, Takato Osaka, Taito Inubushi, Yuichi Ito, Atsuki Tanaka, Yuto Matsuyama, Satoshi Yamauchi, Kazuto Yabashi, Makina Ziaja, Beata Atomic Physics Optics Plasma Physics X-ray diffraction of silicon irradiated with tightly focused femtosecond x-ray pulses (photon energy: 11.5 keV, pulse duration: 6 fs) was measured at various x-ray intensities up to $4.6\times10^{19}$ W/cm$^2$. The measurement reveals that the diffraction intensity is highly suppressed when the x-ray intensity reaches of the order of $10^{19}$ W/cm$^2$. With a dedicated simulation, we confirm the observed reduction of the diffraction intensity is attributed to the femtosecond change in individual atomic scattering factors due to the ultrafast creation of highly ionized atoms through photoionization, Auger decay, and subsequent collisional ionization. We anticipate that this ultrafast reduction of atomic scattering factor will be a basis for new x-ray nonlinear techniques, such as pulse shortening and contrast variation x-ray scattering. |
| title | Femtosecond reduction of atomic scattering factors triggered by intense x-ray pulse |
| topic | Atomic Physics Optics Plasma Physics |
| url | https://arxiv.org/abs/2304.05948 |