Saved in:
| Main Authors: | , , , |
|---|---|
| Format: | Preprint |
| Published: |
2023
|
| Subjects: | |
| Online Access: | https://arxiv.org/abs/2304.07815 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| _version_ | 1866912669192159232 |
|---|---|
| author | He, Xin-Tao Zhang, Shuo-Shi Chen, Xiao-Dong Dong, Jian-Wen |
| author_facet | He, Xin-Tao Zhang, Shuo-Shi Chen, Xiao-Dong Dong, Jian-Wen |
| contents | Refractive index is a fundamental electromagnetic (EM) parameter that can describe photonic continuous media (PCM) traditionally as either transparency or opacity. Recently, topological theory offers a new set of phases to characterize PCM as either trivial or nontrivial, by using topological invariant which are not direct to EM parameters. As all of optical properties in PCM should be related to EM parameters, we formulate a topological index based on EM parameters and establish its phase map in this work. The map can analytically describe the deterministic condition for a topologically nontrivial phase. Our findings indicate that the topology of 2D bi-anisotropic PCM is determined by the sign of the topological index. Another EM parameter of pseudo surface impedance is also introduced for the opaque regions of PCM, showing that the topological opacity has a full range of impedance values ranging from negative to positive, while the trivial case only has either negative or positive impedance. The simulation results show that an interface between two opacities with differing index signs can support robustly optical propagation of topological edge states. As the index only depends on EM parameters, it will pave an insightful way to further understand the intrinsic properties of photonic topology. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2304_07815 |
| institution | arXiv |
| publishDate | 2023 |
| record_format | arxiv |
| spellingShingle | Classification of Topological Phase in 2D Photonic Continuous Media Using Electromagnetic Parameters He, Xin-Tao Zhang, Shuo-Shi Chen, Xiao-Dong Dong, Jian-Wen Optics Refractive index is a fundamental electromagnetic (EM) parameter that can describe photonic continuous media (PCM) traditionally as either transparency or opacity. Recently, topological theory offers a new set of phases to characterize PCM as either trivial or nontrivial, by using topological invariant which are not direct to EM parameters. As all of optical properties in PCM should be related to EM parameters, we formulate a topological index based on EM parameters and establish its phase map in this work. The map can analytically describe the deterministic condition for a topologically nontrivial phase. Our findings indicate that the topology of 2D bi-anisotropic PCM is determined by the sign of the topological index. Another EM parameter of pseudo surface impedance is also introduced for the opaque regions of PCM, showing that the topological opacity has a full range of impedance values ranging from negative to positive, while the trivial case only has either negative or positive impedance. The simulation results show that an interface between two opacities with differing index signs can support robustly optical propagation of topological edge states. As the index only depends on EM parameters, it will pave an insightful way to further understand the intrinsic properties of photonic topology. |
| title | Classification of Topological Phase in 2D Photonic Continuous Media Using Electromagnetic Parameters |
| topic | Optics |
| url | https://arxiv.org/abs/2304.07815 |