Gate-modulated reflectance spectroscopy for detecting excitonic species in two-dimensional semiconductors

Fuente: arXiv
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Main Authors: Xue, Mengsong, Watanabe, Kenji, Taniguchi, Takashi, Kitaura, Ryo
Format: Preprint
Published: 2023
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author Xue, Mengsong
Watanabe, Kenji
Taniguchi, Takashi
Kitaura, Ryo
author_facet Xue, Mengsong
Watanabe, Kenji
Taniguchi, Takashi
Kitaura, Ryo
contents We have developed a microspectroscopy technique for measuring gate-modulated reflectance to probe excitonic states in two-dimensional transition metal dichalcogenides. Successfully observing excited states of excitons from cryogenic to room temperature showed that this method is more sensitive to excitonic signals than traditional reflectance spectroscopy. Our results demonstrated the potential of this reflectance spectroscopy method in studying exciton physics in two-dimensional transition metal dichalcogenides and their heterostructures.
format Preprint
id arxiv_https___arxiv_org_abs_2305_04471
institution arXiv
publishDate 2023
record_format arxiv
spellingShingle Gate-modulated reflectance spectroscopy for detecting excitonic species in two-dimensional semiconductors
Xue, Mengsong
Watanabe, Kenji
Taniguchi, Takashi
Kitaura, Ryo
Mesoscale and Nanoscale Physics
Materials Science
We have developed a microspectroscopy technique for measuring gate-modulated reflectance to probe excitonic states in two-dimensional transition metal dichalcogenides. Successfully observing excited states of excitons from cryogenic to room temperature showed that this method is more sensitive to excitonic signals than traditional reflectance spectroscopy. Our results demonstrated the potential of this reflectance spectroscopy method in studying exciton physics in two-dimensional transition metal dichalcogenides and their heterostructures.
title Gate-modulated reflectance spectroscopy for detecting excitonic species in two-dimensional semiconductors
topic Mesoscale and Nanoscale Physics
Materials Science
url https://arxiv.org/abs/2305.04471