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Gate-modulated reflectance spectroscopy for detecting excitonic species in two-dimensional semiconductors

Fuente: arXiv

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Détails bibliographiques
Auteurs principaux:	Xue, Mengsong, Watanabe, Kenji, Taniguchi, Takashi, Kitaura, Ryo
Format:	Preprint
Publié:	2023
Sujets:	Mesoscale and Nanoscale Physics Materials Science
Accès en ligne:	Acceder al recurso
Tags:	Ajouter un tag Pas de tags, Soyez le premier à ajouter un tag!

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