A method to determine the M2 beam quality from the electric field in a single plane
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arXiv
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| Hauptverfasser: | , , |
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| Format: | Preprint |
| Veröffentlicht: |
2023
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| _version_ | 1866916075899191296 |
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| author | Griessmann, M. H. Martinez-Becerril, A. C. Lundeen, J. S. |
| author_facet | Griessmann, M. H. Martinez-Becerril, A. C. Lundeen, J. S. |
| contents | Laser beam quality is a key parameter for both industry and science. However, the most common measure, the M2 parameter, requires numerous intensity spatial-profiles for its determination. This is particularly inconvenient for modelling the impact of photonic devices on M2, such as metalenses and thin-film stacks, since models typically output a single electric field spatial-profile. Such a profile is also commonly determined in experiments from e.g., Shack-Hartmann sensors, shear plates, or off-axis holography. We introduce and test the validity and limitations of an explicit method to calculate M2 from a single electric field spatial-profile of the beam in any chosen transverse plane along the propagation direction. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2305_07724 |
| institution | arXiv |
| publishDate | 2023 |
| record_format | arxiv |
| spellingShingle | A method to determine the M2 beam quality from the electric field in a single plane Griessmann, M. H. Martinez-Becerril, A. C. Lundeen, J. S. Optics Laser beam quality is a key parameter for both industry and science. However, the most common measure, the M2 parameter, requires numerous intensity spatial-profiles for its determination. This is particularly inconvenient for modelling the impact of photonic devices on M2, such as metalenses and thin-film stacks, since models typically output a single electric field spatial-profile. Such a profile is also commonly determined in experiments from e.g., Shack-Hartmann sensors, shear plates, or off-axis holography. We introduce and test the validity and limitations of an explicit method to calculate M2 from a single electric field spatial-profile of the beam in any chosen transverse plane along the propagation direction. |
| title | A method to determine the M2 beam quality from the electric field in a single plane |
| topic | Optics |
| url | https://arxiv.org/abs/2305.07724 |