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A method to determine the M2 beam quality from the electric field in a single plane

Fuente: arXiv

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Bibliographic Details
Main Authors:	Griessmann, M. H., Martinez-Becerril, A. C., Lundeen, J. S.
Format:	Preprint
Published:	2023
Subjects:	Optics
Online Access:	Acceder al recurso
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