A Distributed Conductance Tester Without Global Information Collection

Fuente: arXiv

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Bibliographic Details
Main Authors:	Batu, Tugkan, Trehan, Amitabh, Trehan, Chhaya
Format:	Preprint
Published:	2023
Subjects:	Distributed, Parallel, and Cluster Computing Data Structures and Algorithms
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2305.14178