Toward Cost-effective Adaptive Random Testing: An Approximate Nearest Neighbor Approach

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Main Authors: Huang, Rubing, Cui, Chenhui, Lian, Junlong, Towey, Dave, Sun, Weifeng, Chen, Haibo
Format: Preprint
Published: 2023
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author Huang, Rubing
Cui, Chenhui
Lian, Junlong
Towey, Dave
Sun, Weifeng
Chen, Haibo
author_facet Huang, Rubing
Cui, Chenhui
Lian, Junlong
Towey, Dave
Sun, Weifeng
Chen, Haibo
contents Adaptive Random Testing (ART) enhances the testing effectiveness (including fault-detection capability) of Random Testing (RT) by increasing the diversity of the random test cases throughout the input domain. Many ART algorithms have been investigated such as Fixed-Size-Candidate-Set ART (FSCS) and Restricted Random Testing (RRT), and have been widely used in many practical applications. Despite its popularity, ART suffers from the problem of high computational costs during test-case generation, especially as the number of test cases increases. Although several strategies have been proposed to enhance the ART testing efficiency, such as the forgetting strategy and the k-dimensional tree strategy, these algorithms still face some challenges, including: (1) Although these algorithms can reduce the computation time, their execution costs are still very high, especially when the number of test cases is large; and (2) To achieve low computational costs, they may sacrifice some fault-detection capability. In this paper, we propose an approach based on Approximate Nearest Neighbors (ANNs), called Locality-Sensitive Hashing ART (LSH-ART). When calculating distances among different test inputs, LSH-ART identifies the approximate (not necessarily exact) nearest neighbors for candidates in an efficient way. LSH-ART attempts to balance ART testing effectiveness and efficiency.
format Preprint
id arxiv_https___arxiv_org_abs_2305_17496
institution arXiv
publishDate 2023
record_format arxiv
spellingShingle Toward Cost-effective Adaptive Random Testing: An Approximate Nearest Neighbor Approach
Huang, Rubing
Cui, Chenhui
Lian, Junlong
Towey, Dave
Sun, Weifeng
Chen, Haibo
Software Engineering
Adaptive Random Testing (ART) enhances the testing effectiveness (including fault-detection capability) of Random Testing (RT) by increasing the diversity of the random test cases throughout the input domain. Many ART algorithms have been investigated such as Fixed-Size-Candidate-Set ART (FSCS) and Restricted Random Testing (RRT), and have been widely used in many practical applications. Despite its popularity, ART suffers from the problem of high computational costs during test-case generation, especially as the number of test cases increases. Although several strategies have been proposed to enhance the ART testing efficiency, such as the forgetting strategy and the k-dimensional tree strategy, these algorithms still face some challenges, including: (1) Although these algorithms can reduce the computation time, their execution costs are still very high, especially when the number of test cases is large; and (2) To achieve low computational costs, they may sacrifice some fault-detection capability. In this paper, we propose an approach based on Approximate Nearest Neighbors (ANNs), called Locality-Sensitive Hashing ART (LSH-ART). When calculating distances among different test inputs, LSH-ART identifies the approximate (not necessarily exact) nearest neighbors for candidates in an efficient way. LSH-ART attempts to balance ART testing effectiveness and efficiency.
title Toward Cost-effective Adaptive Random Testing: An Approximate Nearest Neighbor Approach
topic Software Engineering
url https://arxiv.org/abs/2305.17496