DeepVAT: A Self-Supervised Technique for Cluster Assessment in Image Datasets

Fuente: arXiv
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Main Authors: Mazumder, Alokendu, Baruah, Tirthajit, Singh, Akash Kumar, Murthy, Pagadla Krishna, Pattanaik, Vishwajeet, Rathore, Punit
Format: Preprint
Published: 2023
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author Mazumder, Alokendu
Baruah, Tirthajit
Singh, Akash Kumar
Murthy, Pagadla Krishna
Pattanaik, Vishwajeet
Rathore, Punit
author_facet Mazumder, Alokendu
Baruah, Tirthajit
Singh, Akash Kumar
Murthy, Pagadla Krishna
Pattanaik, Vishwajeet
Rathore, Punit
contents Estimating the number of clusters and cluster structures in unlabeled, complex, and high-dimensional datasets (like images) is challenging for traditional clustering algorithms. In recent years, a matrix reordering-based algorithm called Visual Assessment of Tendency (VAT), and its variants have attracted many researchers from various domains to estimate the number of clusters and inherent cluster structure present in the data. However, these algorithms face significant challenges when dealing with image data as they fail to effectively capture the crucial features inherent in images. To overcome these limitations, we propose a deep-learning-based framework that enables the assessment of cluster structure in complex image datasets. Our approach utilizes a self-supervised deep neural network to generate representative embeddings for the data. These embeddings are then reduced to 2-dimension using t-distributed Stochastic Neighbour Embedding (t-SNE) and inputted into VAT based algorithms to estimate the underlying cluster structure. Importantly, our framework does not rely on any prior knowledge of the number of clusters. Our proposed approach demonstrates superior performance compared to state-of-the-art VAT family algorithms and two other deep clustering algorithms on four benchmark image datasets, namely MNIST, FMNIST, CIFAR-10, and INTEL.
format Preprint
id arxiv_https___arxiv_org_abs_2306_00011
institution arXiv
publishDate 2023
record_format arxiv
spellingShingle DeepVAT: A Self-Supervised Technique for Cluster Assessment in Image Datasets
Mazumder, Alokendu
Baruah, Tirthajit
Singh, Akash Kumar
Murthy, Pagadla Krishna
Pattanaik, Vishwajeet
Rathore, Punit
Machine Learning
Computer Vision and Pattern Recognition
Estimating the number of clusters and cluster structures in unlabeled, complex, and high-dimensional datasets (like images) is challenging for traditional clustering algorithms. In recent years, a matrix reordering-based algorithm called Visual Assessment of Tendency (VAT), and its variants have attracted many researchers from various domains to estimate the number of clusters and inherent cluster structure present in the data. However, these algorithms face significant challenges when dealing with image data as they fail to effectively capture the crucial features inherent in images. To overcome these limitations, we propose a deep-learning-based framework that enables the assessment of cluster structure in complex image datasets. Our approach utilizes a self-supervised deep neural network to generate representative embeddings for the data. These embeddings are then reduced to 2-dimension using t-distributed Stochastic Neighbour Embedding (t-SNE) and inputted into VAT based algorithms to estimate the underlying cluster structure. Importantly, our framework does not rely on any prior knowledge of the number of clusters. Our proposed approach demonstrates superior performance compared to state-of-the-art VAT family algorithms and two other deep clustering algorithms on four benchmark image datasets, namely MNIST, FMNIST, CIFAR-10, and INTEL.
title DeepVAT: A Self-Supervised Technique for Cluster Assessment in Image Datasets
topic Machine Learning
Computer Vision and Pattern Recognition
url https://arxiv.org/abs/2306.00011