Out-of-distribution forgetting: vulnerability of continual learning to intra-class distribution shift

Fuente: arXiv
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Hauptverfasser: Guo, Liangxuan, Chen, Yang, Yu, Shan
Format: Preprint
Veröffentlicht: 2023
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author Guo, Liangxuan
Chen, Yang
Yu, Shan
author_facet Guo, Liangxuan
Chen, Yang
Yu, Shan
contents Continual learning (CL) is an important technique to allow artificial neural networks to work in open environments. CL enables a system to learn new tasks without severe interference to its performance on old tasks, i.e., overcome the problems of catastrophic forgetting. In joint learning, it is well known that the out-of-distribution (OOD) problem caused by intentional attacks or environmental perturbations will severely impair the ability of networks to generalize. In this work, we reported a special form of catastrophic forgetting raised by the OOD problem in continual learning settings, and we named it out-of-distribution forgetting (OODF). In continual image classification tasks, we found that for a given category, introducing an intra-class distribution shift significantly impaired the recognition accuracy of CL methods for that category during subsequent learning. Interestingly, this phenomenon is special for CL as the same level of distribution shift had only negligible effects in the joint learning scenario. We verified that CL methods without dedicating subnetworks for individual tasks are all vulnerable to OODF. Moreover, OODF does not depend on any specific way of shifting the distribution, suggesting it is a risk for CL in a wide range of circumstances. Taken together, our work identified an under-attended risk during CL, highlighting the importance of developing approaches that can overcome OODF. Code available: \url{https://github.com/Hiroid/OODF}
format Preprint
id arxiv_https___arxiv_org_abs_2306_00427
institution arXiv
publishDate 2023
record_format arxiv
spellingShingle Out-of-distribution forgetting: vulnerability of continual learning to intra-class distribution shift
Guo, Liangxuan
Chen, Yang
Yu, Shan
Machine Learning
Artificial Intelligence
Computer Vision and Pattern Recognition
Continual learning (CL) is an important technique to allow artificial neural networks to work in open environments. CL enables a system to learn new tasks without severe interference to its performance on old tasks, i.e., overcome the problems of catastrophic forgetting. In joint learning, it is well known that the out-of-distribution (OOD) problem caused by intentional attacks or environmental perturbations will severely impair the ability of networks to generalize. In this work, we reported a special form of catastrophic forgetting raised by the OOD problem in continual learning settings, and we named it out-of-distribution forgetting (OODF). In continual image classification tasks, we found that for a given category, introducing an intra-class distribution shift significantly impaired the recognition accuracy of CL methods for that category during subsequent learning. Interestingly, this phenomenon is special for CL as the same level of distribution shift had only negligible effects in the joint learning scenario. We verified that CL methods without dedicating subnetworks for individual tasks are all vulnerable to OODF. Moreover, OODF does not depend on any specific way of shifting the distribution, suggesting it is a risk for CL in a wide range of circumstances. Taken together, our work identified an under-attended risk during CL, highlighting the importance of developing approaches that can overcome OODF. Code available: \url{https://github.com/Hiroid/OODF}
title Out-of-distribution forgetting: vulnerability of continual learning to intra-class distribution shift
topic Machine Learning
Artificial Intelligence
Computer Vision and Pattern Recognition
url https://arxiv.org/abs/2306.00427