Background contributions in the electron-tracking Compton camera onboard SMILE-2+

Fuente: arXiv
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Hauptverfasser: Ikeda, Tomonori, Takada, Atsushi, Takemura, Taito, Yoshikawa, Kei, nakamura, Yuta, Onozaka, Ken, Abe, Mitsuru, Tanimori, Toru
Format: Preprint
Veröffentlicht: 2023
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author Ikeda, Tomonori
Takada, Atsushi
Takemura, Taito
Yoshikawa, Kei
nakamura, Yuta
Onozaka, Ken
Abe, Mitsuru
Tanimori, Toru
author_facet Ikeda, Tomonori
Takada, Atsushi
Takemura, Taito
Yoshikawa, Kei
nakamura, Yuta
Onozaka, Ken
Abe, Mitsuru
Tanimori, Toru
contents The Mega electron volt (MeV) gamma-ray observation is a promising diagnostic tool for observing the universe. However, the sensitivity of MeV gamma-ray telescopes is limited due to peculiar backgrounds, restricting the application of MeV gamma rays for observation. Identification of backgrounds is crucial for designing next-generation telescopes. Therefore, herein, we assessed the background contribution in the electron-tracking Compton camera (ETCC) on board the SMILE- 2+ balloon experiment. This assessment was performed using the Monte Carlo simulation. The results revealed that the background below 400 keV existed due to the atmospheric gamma-ray background, the cosmic-ray/secondary-particle background, and the accidental background. On the other hand, the unresolved background component, which was not likely to be relevant to direct Compton-scattering events in the ETCC, was confirmed above 400 keV. Overall, this study demonstrated that the Compton-kinematics test provides a powerful tool to remove the background and principally improves the signal-to-noise ratio at 400 keV by an order of magnitude.
format Preprint
id arxiv_https___arxiv_org_abs_2306_02700
institution arXiv
publishDate 2023
record_format arxiv
spellingShingle Background contributions in the electron-tracking Compton camera onboard SMILE-2+
Ikeda, Tomonori
Takada, Atsushi
Takemura, Taito
Yoshikawa, Kei
nakamura, Yuta
Onozaka, Ken
Abe, Mitsuru
Tanimori, Toru
Instrumentation and Methods for Astrophysics
The Mega electron volt (MeV) gamma-ray observation is a promising diagnostic tool for observing the universe. However, the sensitivity of MeV gamma-ray telescopes is limited due to peculiar backgrounds, restricting the application of MeV gamma rays for observation. Identification of backgrounds is crucial for designing next-generation telescopes. Therefore, herein, we assessed the background contribution in the electron-tracking Compton camera (ETCC) on board the SMILE- 2+ balloon experiment. This assessment was performed using the Monte Carlo simulation. The results revealed that the background below 400 keV existed due to the atmospheric gamma-ray background, the cosmic-ray/secondary-particle background, and the accidental background. On the other hand, the unresolved background component, which was not likely to be relevant to direct Compton-scattering events in the ETCC, was confirmed above 400 keV. Overall, this study demonstrated that the Compton-kinematics test provides a powerful tool to remove the background and principally improves the signal-to-noise ratio at 400 keV by an order of magnitude.
title Background contributions in the electron-tracking Compton camera onboard SMILE-2+
topic Instrumentation and Methods for Astrophysics
url https://arxiv.org/abs/2306.02700