Industrial Anomaly Detection and Localization Using Weakly-Supervised Residual Transformers

Fuente: arXiv

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Bibliographic Details
Main Authors:	Li, Hanxi, Wu, Jingqi, Liu, Deyin, Wu, Lin, Chen, Hao, Wang, Mingwen, Shen, Chunhua
Format:	Preprint
Published:	2023
Subjects:	Computer Vision and Pattern Recognition
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2306.03492