Relativistic ultrafast electron diffraction at high repetition rates
Fuente:
arXiv
Gespeichert in:
| Hauptverfasser: | , , , , , , , , , , , , , , , , , , , |
|---|---|
| Format: | Preprint |
| Veröffentlicht: |
2023
|
| Schlagworte: | |
| Online-Zugang: | |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| _version_ | 1866909605094752256 |
|---|---|
| author | Siddiqui, K. M. Durham, D. B. Cropp, F. Ji, F. Paiagua, S. Ophus, C. Andresen, N. C. Jin, L. Wu, J. Wang, S. Zhang, X. You, W. Murnane, M. Centurion, M. Wang, X. Slaughter, D. S. Kaindl, R. A. Musumeci, P. Minor, A. M. Filippetto, D. |
| author_facet | Siddiqui, K. M. Durham, D. B. Cropp, F. Ji, F. Paiagua, S. Ophus, C. Andresen, N. C. Jin, L. Wu, J. Wang, S. Zhang, X. You, W. Murnane, M. Centurion, M. Wang, X. Slaughter, D. S. Kaindl, R. A. Musumeci, P. Minor, A. M. Filippetto, D. |
| contents | The ability to resolve the dynamics of matter on its native temporal and spatial scales constitutes a key challenge and convergent theme across chemistry, biology, and materials science. The last couple of decades have witnessed ultrafast electron diffraction (UED) emerge as one of the forefront techniques with the sensitivity to resolve atomic motions. Increasingly sophisticated UED instruments are being developed that are aimed at increasing the beam brightness in order to observe structural signatures, but so far they have been limited to low average current beams. Here we present the technical design and capabilities of the HiRES (High Repetition Rate Electron Scattering) instrument, which blends relativistic electrons and high repetition rates to achieve orders of magnitude improvement in average beam current compared to the existing state-of-the-art UED instruments. The setup utilizes a novel electron source to deliver femtosecond duration electron pulses at up to MHz repetition rates for UED experiments. We provide example cases of diffraction measurements on solid-state and gas-phase samples, including both micro- and nanodiffraction modes, which showcase the potential of the instrument for novel UED experiments. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2306_04900 |
| institution | arXiv |
| publishDate | 2023 |
| record_format | arxiv |
| spellingShingle | Relativistic ultrafast electron diffraction at high repetition rates Siddiqui, K. M. Durham, D. B. Cropp, F. Ji, F. Paiagua, S. Ophus, C. Andresen, N. C. Jin, L. Wu, J. Wang, S. Zhang, X. You, W. Murnane, M. Centurion, M. Wang, X. Slaughter, D. S. Kaindl, R. A. Musumeci, P. Minor, A. M. Filippetto, D. Instrumentation and Detectors Materials Science Accelerator Physics The ability to resolve the dynamics of matter on its native temporal and spatial scales constitutes a key challenge and convergent theme across chemistry, biology, and materials science. The last couple of decades have witnessed ultrafast electron diffraction (UED) emerge as one of the forefront techniques with the sensitivity to resolve atomic motions. Increasingly sophisticated UED instruments are being developed that are aimed at increasing the beam brightness in order to observe structural signatures, but so far they have been limited to low average current beams. Here we present the technical design and capabilities of the HiRES (High Repetition Rate Electron Scattering) instrument, which blends relativistic electrons and high repetition rates to achieve orders of magnitude improvement in average beam current compared to the existing state-of-the-art UED instruments. The setup utilizes a novel electron source to deliver femtosecond duration electron pulses at up to MHz repetition rates for UED experiments. We provide example cases of diffraction measurements on solid-state and gas-phase samples, including both micro- and nanodiffraction modes, which showcase the potential of the instrument for novel UED experiments. |
| title | Relativistic ultrafast electron diffraction at high repetition rates |
| topic | Instrumentation and Detectors Materials Science Accelerator Physics |
| url | https://arxiv.org/abs/2306.04900 |