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Spatially resolved dielectric loss at the Si/SiO$_2$ interface

Fuente: arXiv

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Bibliographic Details
Main Authors:	Cowie, Megan, Stock, Taylor J. Z., Constantinou, Procopios C., Curson, Neil, Grütter, Peter
Format:	Preprint
Published:	2023
Subjects:	Materials Science
Online Access:	Acceder al recurso
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