Cross-Validation Is All You Need: A Statistical Approach To Label Noise Estimation

Fuente: arXiv

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Bibliographic Details
Main Authors:	Chen, Jianan, Ramanathan, Vishwesh, Xu, Tony, Martel, Anne L.
Format:	Preprint
Published:	2023
Subjects:	Machine Learning Computer Vision and Pattern Recognition
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2306.13990