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Cross-Validation Is All You Need: A Statistical Approach To Label Noise Estimation

Fuente: arXiv

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Détails bibliographiques
Auteurs principaux:	Chen, Jianan, Ramanathan, Vishwesh, Xu, Tony, Martel, Anne L.
Format:	Preprint
Publié:	2023
Sujets:	Machine Learning Computer Vision and Pattern Recognition
Accès en ligne:	Acceder al recurso
Tags:	Ajouter un tag Pas de tags, Soyez le premier à ajouter un tag!

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