A Meta-analytical Comparison of Naive Bayes and Random Forest for Software Defect Prediction

Fuente: arXiv

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Bibliographic Details
Main Authors:	Awais, Ch Muhammad, Gu, Wei, Dlamini, Gcinizwe, Kholmatova, Zamira, Succi, Giancarlo
Format:	Preprint
Published:	2023
Subjects:	Software Engineering Machine Learning
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2306.15369