A Meta-analytical Comparison of Naive Bayes and Random Forest for Software Defect Prediction
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arXiv
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| Format: | Preprint |
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2023
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| _version_ | 1866917548400836608 |
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| author | Awais, Ch Muhammad Gu, Wei Dlamini, Gcinizwe Kholmatova, Zamira Succi, Giancarlo |
| author_facet | Awais, Ch Muhammad Gu, Wei Dlamini, Gcinizwe Kholmatova, Zamira Succi, Giancarlo |
| contents | Is there a statistical difference between Naive Bayes and Random Forest in terms of recall, f-measure, and precision for predicting software defects? By utilizing systematic literature review and meta-analysis, we are answering this question. We conducted a systematic literature review by establishing criteria to search and choose papers, resulting in five studies. After that, using the meta-data and forest-plots of five chosen papers, we conducted a meta-analysis to compare the two models. The results have shown that there is no significant statistical evidence that Naive Bayes perform differently from Random Forest in terms of recall, f-measure, and precision. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2306_15369 |
| institution | arXiv |
| publishDate | 2023 |
| record_format | arxiv |
| spellingShingle | A Meta-analytical Comparison of Naive Bayes and Random Forest for Software Defect Prediction Awais, Ch Muhammad Gu, Wei Dlamini, Gcinizwe Kholmatova, Zamira Succi, Giancarlo Software Engineering Machine Learning Is there a statistical difference between Naive Bayes and Random Forest in terms of recall, f-measure, and precision for predicting software defects? By utilizing systematic literature review and meta-analysis, we are answering this question. We conducted a systematic literature review by establishing criteria to search and choose papers, resulting in five studies. After that, using the meta-data and forest-plots of five chosen papers, we conducted a meta-analysis to compare the two models. The results have shown that there is no significant statistical evidence that Naive Bayes perform differently from Random Forest in terms of recall, f-measure, and precision. |
| title | A Meta-analytical Comparison of Naive Bayes and Random Forest for Software Defect Prediction |
| topic | Software Engineering Machine Learning |
| url | https://arxiv.org/abs/2306.15369 |