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A Meta-analytical Comparison of Naive Bayes and Random Forest for Software Defect Prediction

Fuente: arXiv

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Detalles Bibliográficos
Autores principales:	Awais, Ch Muhammad, Gu, Wei, Dlamini, Gcinizwe, Kholmatova, Zamira, Succi, Giancarlo
Formato:	Preprint
Publicado:	2023
Materias:	Software Engineering Machine Learning
Acceso en línea:	Acceder al recurso
Etiquetas:	Agregar Etiqueta Sin Etiquetas, Sea el primero en etiquetar este registro!

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