Quantum-enhanced metrology with large Fock states

Fuente: arXiv
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Main Authors: Deng, Xiaowei, Li, Sai, Chen, Zi-Jie, Ni, Zhongchu, Cai, Yanyan, Mai, Jiasheng, Zhang, Libo, Zheng, Pan, Yu, Haifeng, Zou, Chang-Ling, Liu, Song, Yan, Fei, Xu, Yuan, Yu, Dapeng
Format: Preprint
Published: 2023
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author Deng, Xiaowei
Li, Sai
Chen, Zi-Jie
Ni, Zhongchu
Cai, Yanyan
Mai, Jiasheng
Zhang, Libo
Zheng, Pan
Yu, Haifeng
Zou, Chang-Ling
Liu, Song
Yan, Fei
Xu, Yuan
Yu, Dapeng
author_facet Deng, Xiaowei
Li, Sai
Chen, Zi-Jie
Ni, Zhongchu
Cai, Yanyan
Mai, Jiasheng
Zhang, Libo
Zheng, Pan
Yu, Haifeng
Zou, Chang-Ling
Liu, Song
Yan, Fei
Xu, Yuan
Yu, Dapeng
contents Quantum metrology uses non-classical states, such as Fock states with a specific number of photons, to achieve an advantage over classical sensing methods. Typically, quantum metrological performance can be enhanced by increasing the involved excitation numbers, for example, by using large photon-number Fock states. However, manipulating these states and demonstrating a quantum metrological advantage is experimentally challenging. Here we present an efficient method for generating large Fock states approaching 100 photons within a superconducting microwave cavity through the development of a programmable photon number filter. Using these states in displacement and phase measurements, we demonstrate quantum-enhanced metrology approaching the Heisenberg scaling for 40-photon Fock states and achieve a maximum metrological gain of up to 14.8 dB, highlighting the metrological advantages of large Fock states. Our study could be readily extended to mechanical and optical systems, promising potential applications in weak force detection and dark matter searches.
format Preprint
id arxiv_https___arxiv_org_abs_2306_16919
institution arXiv
publishDate 2023
record_format arxiv
spellingShingle Quantum-enhanced metrology with large Fock states
Deng, Xiaowei
Li, Sai
Chen, Zi-Jie
Ni, Zhongchu
Cai, Yanyan
Mai, Jiasheng
Zhang, Libo
Zheng, Pan
Yu, Haifeng
Zou, Chang-Ling
Liu, Song
Yan, Fei
Xu, Yuan
Yu, Dapeng
Quantum Physics
Quantum metrology uses non-classical states, such as Fock states with a specific number of photons, to achieve an advantage over classical sensing methods. Typically, quantum metrological performance can be enhanced by increasing the involved excitation numbers, for example, by using large photon-number Fock states. However, manipulating these states and demonstrating a quantum metrological advantage is experimentally challenging. Here we present an efficient method for generating large Fock states approaching 100 photons within a superconducting microwave cavity through the development of a programmable photon number filter. Using these states in displacement and phase measurements, we demonstrate quantum-enhanced metrology approaching the Heisenberg scaling for 40-photon Fock states and achieve a maximum metrological gain of up to 14.8 dB, highlighting the metrological advantages of large Fock states. Our study could be readily extended to mechanical and optical systems, promising potential applications in weak force detection and dark matter searches.
title Quantum-enhanced metrology with large Fock states
topic Quantum Physics
url https://arxiv.org/abs/2306.16919