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Auteur principal: Sun, Changping
Format: Preprint
Publié: 2023
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Accès en ligne:https://arxiv.org/abs/2307.04402
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author Sun, Changping
author_facet Sun, Changping
contents In this paper,firstly,to overcome the shortcoming of traditional ARX model, a new operator between an interval number and a real matrix is defined, and then it is applied to the traditional ARX model to get a new type of structure interval ARX model that can deal with interval data, which is defined as interval ARX model (IARX). Secondly,the IARX model is applied to moving pattern-based modeling. Finally,to verify the validity of the proposed modeling method,it is applied to a sintering process. The simulation results show the moving pattern-based modeling using the new type of interval ARX model is robust to variation in parameters of the model, and the performance of the modeling using the proposed IARX is superior to that of the previous work.
format Preprint
id arxiv_https___arxiv_org_abs_2307_04402
institution arXiv
publishDate 2023
record_format arxiv
spellingShingle Moving pattern-based modeling using a new type of interval ARX model
Sun, Changping
Methodology
Computer Vision and Pattern Recognition
Systems and Control
In this paper,firstly,to overcome the shortcoming of traditional ARX model, a new operator between an interval number and a real matrix is defined, and then it is applied to the traditional ARX model to get a new type of structure interval ARX model that can deal with interval data, which is defined as interval ARX model (IARX). Secondly,the IARX model is applied to moving pattern-based modeling. Finally,to verify the validity of the proposed modeling method,it is applied to a sintering process. The simulation results show the moving pattern-based modeling using the new type of interval ARX model is robust to variation in parameters of the model, and the performance of the modeling using the proposed IARX is superior to that of the previous work.
title Moving pattern-based modeling using a new type of interval ARX model
topic Methodology
Computer Vision and Pattern Recognition
Systems and Control
url https://arxiv.org/abs/2307.04402