Quantum metrology in the finite-sample regime

Fuente: arXiv

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Bibliographic Details
Main Authors:	Meyer, Johannes Jakob, Khatri, Sumeet, França, Daniel Stilck, Eisert, Jens, Faist, Philippe
Format:	Preprint
Published:	2023
Subjects:	Quantum Physics
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2307.06370