Robust Bayesian inference for nondestructive one-shot device testing data under competing risk using Hamiltonian Monte Carlo method

Fuente: arXiv
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Main Authors: Baghel, Shanya, Mondal, Shuvashree
Format: Preprint
Published: 2023
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author Baghel, Shanya
Mondal, Shuvashree
author_facet Baghel, Shanya
Mondal, Shuvashree
contents The prevalence of one-shot devices is quite prolific in engineering and medical domains. Unlike typical one-shot devices, nondestructive one-shot devices (NOSD) may survive multiple tests and offer additional data for reliability estimation. This study aims to implement the Bayesian approach of the lifetime prognosis of NOSD when failures are subject to multiple risks. With small deviations from the assumed model conditions, conventional likelihood-based Bayesian estimation may result in misleading statistical inference, raising the need for a robust Bayesian method. This work develops Bayesian estimation by exploiting a robustified posterior based on the density power divergence measure for NOSD test data. Further, the testing of the hypothesis is carried out by applying a proposed Bayes factor derived from the robustified posterior. A flexible Hamiltonian Monte Carlo approach is applied to generate posterior samples. Additionally, we assess the extent of resistance of the proposed methods to small deviations from the assumed model conditions by applying the influence function (IF) approach. In testing of hypothesis, IF reflects how outliers impact the decision-making through Bayes factor under null hypothesis. Finally, this analytical development is validated through a simulation study and a data analysis based on cancer data.
format Preprint
id arxiv_https___arxiv_org_abs_2307_12557
institution arXiv
publishDate 2023
record_format arxiv
spellingShingle Robust Bayesian inference for nondestructive one-shot device testing data under competing risk using Hamiltonian Monte Carlo method
Baghel, Shanya
Mondal, Shuvashree
Methodology
Statistics Theory
62F10, 62F12, 62NO2
The prevalence of one-shot devices is quite prolific in engineering and medical domains. Unlike typical one-shot devices, nondestructive one-shot devices (NOSD) may survive multiple tests and offer additional data for reliability estimation. This study aims to implement the Bayesian approach of the lifetime prognosis of NOSD when failures are subject to multiple risks. With small deviations from the assumed model conditions, conventional likelihood-based Bayesian estimation may result in misleading statistical inference, raising the need for a robust Bayesian method. This work develops Bayesian estimation by exploiting a robustified posterior based on the density power divergence measure for NOSD test data. Further, the testing of the hypothesis is carried out by applying a proposed Bayes factor derived from the robustified posterior. A flexible Hamiltonian Monte Carlo approach is applied to generate posterior samples. Additionally, we assess the extent of resistance of the proposed methods to small deviations from the assumed model conditions by applying the influence function (IF) approach. In testing of hypothesis, IF reflects how outliers impact the decision-making through Bayes factor under null hypothesis. Finally, this analytical development is validated through a simulation study and a data analysis based on cancer data.
title Robust Bayesian inference for nondestructive one-shot device testing data under competing risk using Hamiltonian Monte Carlo method
topic Methodology
Statistics Theory
62F10, 62F12, 62NO2
url https://arxiv.org/abs/2307.12557