Raman spectroscopy of monolayer to bulk PtSe2 exfoliated crystals
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arXiv
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| Auteurs principaux: | , , , , , , |
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| Format: | Preprint |
| Publié: |
2023
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| _version_ | 1866913232721018880 |
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| author | Tharrault, Marin Desgué, Eva Carisetti, Dominique Plaçais, Bernard Voisin, Christophe Legagneux, Pierre Baudin, Emmanuel |
| author_facet | Tharrault, Marin Desgué, Eva Carisetti, Dominique Plaçais, Bernard Voisin, Christophe Legagneux, Pierre Baudin, Emmanuel |
| contents | Raman spectroscopy is widely used to assess the quality of 2D materials thin films. This report focuses on $\rm{PtSe_2}$, a noble transition metal dichalcogenide which has the remarkable property to transit from a semi-conductor to a semi-metal with increasing layer number. While polycrystalline $\rm{PtSe_2}$ can be grown with various crystalline qualities, getting insight into the monocrystalline intrinsic properties remains challenging. We report on the study of exfoliated 1 to 10 layers $\rm{PtSe_2}$ by Raman spectroscopy, featuring record linewidth. The clear Raman signatures allow layer-thickness identification and provides a reference metrics to assess crystal quality of grown films. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2307_15520 |
| institution | arXiv |
| publishDate | 2023 |
| record_format | arxiv |
| spellingShingle | Raman spectroscopy of monolayer to bulk PtSe2 exfoliated crystals Tharrault, Marin Desgué, Eva Carisetti, Dominique Plaçais, Bernard Voisin, Christophe Legagneux, Pierre Baudin, Emmanuel Materials Science Mesoscale and Nanoscale Physics Raman spectroscopy is widely used to assess the quality of 2D materials thin films. This report focuses on $\rm{PtSe_2}$, a noble transition metal dichalcogenide which has the remarkable property to transit from a semi-conductor to a semi-metal with increasing layer number. While polycrystalline $\rm{PtSe_2}$ can be grown with various crystalline qualities, getting insight into the monocrystalline intrinsic properties remains challenging. We report on the study of exfoliated 1 to 10 layers $\rm{PtSe_2}$ by Raman spectroscopy, featuring record linewidth. The clear Raman signatures allow layer-thickness identification and provides a reference metrics to assess crystal quality of grown films. |
| title | Raman spectroscopy of monolayer to bulk PtSe2 exfoliated crystals |
| topic | Materials Science Mesoscale and Nanoscale Physics |
| url | https://arxiv.org/abs/2307.15520 |