Electron thermalization length in solid para-hydrogen at low-temperature
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arXiv
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| Auteurs principaux: | , , , |
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| Format: | Preprint |
| Publié: |
2023
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| _version_ | 1866929292911312896 |
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| author | Borghesani, A. F. Carugno, G. Messineo, G. Pazzini, J. |
| author_facet | Borghesani, A. F. Carugno, G. Messineo, G. Pazzini, J. |
| contents | We report the first ever measurements of the thermalization length of low-energy electrons injected into solid para-hydrogen at a temperature \(T\approx 2.8\,\)K. The use of the pulsed Townsend photoinjection technique has allowed us to investigate the behavior of quasi-free electrons rather than of massive, slow negative charges as reported in all previous literature. We have found an average thermalization length \(\langle z_0\rangle\approx 260\,\)Å which is 3 to 5 times longer than that in liquid helium at the same temperature. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2307_15963 |
| institution | arXiv |
| publishDate | 2023 |
| record_format | arxiv |
| spellingShingle | Electron thermalization length in solid para-hydrogen at low-temperature Borghesani, A. F. Carugno, G. Messineo, G. Pazzini, J. Chemical Physics We report the first ever measurements of the thermalization length of low-energy electrons injected into solid para-hydrogen at a temperature \(T\approx 2.8\,\)K. The use of the pulsed Townsend photoinjection technique has allowed us to investigate the behavior of quasi-free electrons rather than of massive, slow negative charges as reported in all previous literature. We have found an average thermalization length \(\langle z_0\rangle\approx 260\,\)Å which is 3 to 5 times longer than that in liquid helium at the same temperature. |
| title | Electron thermalization length in solid para-hydrogen at low-temperature |
| topic | Chemical Physics |
| url | https://arxiv.org/abs/2307.15963 |